SURFACE CRYSTALLOGRAPHY OF THIN-FILMS BY ELECTRON-DIFFRACTION IN THE STEM

被引：0
作者：
TRUSZKOWSKA, K
YACAMAN, MJ
机构：
来源：
SURFACE SCIENCE | 1983年 / 127卷 / 03期
关键词：
D O I：
暂无
中图分类号：
O64 [物理化学（理论化学）、化学物理学];
学科分类号：
070304 ; 081704 ;
摘要：
引用
收藏
页码：L159 / L164
页数：6
相关论文
共 50 条
[31]   QUASIKINEMATIC LOW-ENERGY ELECTRON-DIFFRACTION SURFACE CRYSTALLOGRAPHY [J].
JIA, JF ;
ZHAO, RG ;
YANG, WS .
PHYSICAL REVIEW B, 1993, 48 (24) :18101-18108
[32]   USE OF ELECTRON-DIFFRACTION INTENSITIES TO DETECT IMPERFECT FIBER ORIENTATION IN VERY THIN-FILMS [J].
WHITE, JR .
THIN SOLID FILMS, 1974, 22 (01) :11-21
[33]   OBTAINING THIN-FILMS OF GD, SM AND EU OXIDES AND THEIR STRUCTURAL EXAMINATION BY ELECTRON-DIFFRACTION [J].
SEMILETOV, SA ;
IMAMOV, RM ;
RAGIMLI, NA .
RUSSIAN METALLURGY, 1975, (06) :60-64
[34]   LOW-ENERGY ELECTRON-DIFFRACTION AND SURFACE CRYSTALLOGRAPHY OF POLYCRYSTALS [J].
MUSILOVA, J .
CESKOSLOVENSKY CASOPIS PRO FYSIKU SEKCE A, 1975, 25 (03) :267-272
[35]   ELECTRON-DIFFRACTION AND DIFFRACTION CONTRAST IMAGING OF THIN ORGANIC FILMS [J].
HUI, SW .
JOURNAL OF ELECTRON MICROSCOPY TECHNIQUE, 1989, 11 (04) :286-297
[36]   ELECTRON-DIFFRACTION ANALYSIS IN PROTEIN CRYSTALLOGRAPHY [J].
CHANG, BB ;
PARSONS, DF .
BIOPHYSICAL JOURNAL, 1979, 25 (02) :A282-A282
[37]   OPTICAL-DIFFRACTION METHODS OF STUDYING ELECTRON-DIFFRACTION PATTERNS OF THIN-FILMS OF COPPER-GOLD ALLOYS [J].
LIPSON, H ;
MICHAEL, WS .
JOURNAL OF APPLIED CRYSTALLOGRAPHY, 1974, 7 (DEC1) :577-585
[38]   ELECTRON-DIFFRACTION STUDIES OF CONTACT REACTIONS IN AMORPHOUS AS2S3 THIN-FILMS [J].
FITZGERALD, AG .
THIN SOLID FILMS, 1982, 98 (02) :101-107
[39]   STRUCTURAL DETERMINATION OF AMORPHOUS NI-TI THIN-FILMS USING ELECTRON-DIFFRACTION ANALYSIS [J].
MOINE, P ;
DELAGE, J ;
PELTON, AR ;
SINCLAIR, R .
ACTA METALLURGICA ET MATERIALIA, 1992, 40 (08) :1855-1863
[40]   ELECTRON-DIFFRACTION STUDY OF VACUUM-DEPOSITED IN2TE3 THIN-FILMS [J].
ROUSINA, R ;
SHIVAKUMAR, GK .
SURFACE & COATINGS TECHNOLOGY, 1989, 38 (03) :353-358
12345