PROPERTIES OF SUBSTRATES FOR LOW-TEMPERATURE QUANTITATIVE MICROSCOPY AND MICROANALYSIS

被引：0

|

作者：

LAMVIK, MK ^{[1
]}

DAVILLA, SD ^{[1
]}

TUTTLE, J ^{[1
]}

机构：

[1] DUKE UNIV,DEPT PHYS,DURHAM,NC 27706

来源：

SCANNING MICROSCOPY | 1989年

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中图分类号：

TH742 [显微镜];

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页码：271 / 276

页数：6

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