(111)-ORIENTED WHISKERS OF BETA-SIC STUDIED BY FIELD-EMISSION AND FIELD-ION MICROSCOPES

被引：10

作者：

KUDO, J ^{[1
]}

NAKAMURA, S ^{[1
]}

KURODA, T ^{[1
]}

机构：

[1] OSAKA UNIV, INST SCI & IND RES, SUITA, OSAKA, JAPAN

来源：

JAPANESE JOURNAL OF APPLIED PHYSICS | 1975年 / 14卷 / 01期

关键词：

D O I：

10.1143/JJAP.14.52

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

引用

页码：52 / 58

页数：7

共 18 条

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[2] SURFACE STRUCTURE + SURFACE MIGRATION OF GERMANIUM BY FIELD EMISSION MICROSCOPY [J].

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[3] FIELD EMISSION FROM SILICON CARBIDE WHISKERS [J].

BAKER .

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[4] GENERAL FEATURES OF FIELD EMISSION FROM SEMICONDUCTORS [J].

BASKIN, LM ;

LVOV, OI ;

FURSEY, GN .

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[5]

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[6]

BUSCH G, 1958, BROWN BOVERI REV, V45, P532

[7] SOME SURFACE PROPERTIES OF SILICON-CARBIDE CRYSTALS [J].

DILLON, JA ;

SCHLIER, RE ;

FARNSWORTH, HE .

JOURNAL OF APPLIED PHYSICS, 1959, 30 (05) :675-679

[8] STUDY OF GERMANIUM IN FIELD-ION MICROSCOPE [J].

ERNST, L .

SURFACE SCIENCE, 1972, 32 (02) :387-&

[9] FIELD-EMISSION MICROSCOPY OF GERMANIUM [J].

ERNST, L .

PHYSICA STATUS SOLIDI, 1967, 19 (01) :89-&

[10]

GATOS HC, 1967, SURFACES INTERACTION, V1

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