NEW FAST TECHNIQUE FOR LARGE-SCALE MEASUREMENTS OF GENERATION LIFETIME IN SEMICONDUCTORS

被引：19
作者：
FAHRNER, WR [1 ]
SCHNEIDER, CP [1 ]
机构：
[1] IBM CORP, SYST PROD DIV, E FISHKILL FACIL, Hopewell Jct, NY 12533 USA
来源：
JOURNAL OF THE ELECTROCHEMICAL SOCIETY | 1976年 / 123卷 / 01期
关键词：
D O I：
10.1149/1.2132738
中图分类号：
O646 [电化学、电解、磁化学];
学科分类号：
081704 ;
摘要：
引用
收藏
页码：100 / 105
页数：6
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