SPECIAL ISSUE - INTERNATIONAL TEST CONFERENCE

被引：0

|

作者：

SOBOTKA, LJ

机构：

来源：

JOURNAL OF DIGITAL SYSTEMS | 1982年 / 6卷 / 2-3期

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D O I：

暂无

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

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页码：103 / 105

页数：3

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