ON THE X-RAY-ANALYSIS TECHNIQUE FOR ASCERTAINING MACROSCOPIC RESIDUAL-STRESSES IN SURFACE-LAYERS OF METALS

被引：0

|

作者：

KRAUS, I

GOSMANOVA, G

机构：

来源：

KOVOVE MATERIALY-METALLIC MATERIALS | 1990年 / 28卷 / 02期

关键词：

D O I：

暂无

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

引用

收藏

页码：129 / 139

页数：11

相关论文

共 50 条

[31] X-RAY MEASUREMENT OF RESIDUAL-STRESSES IN A MULTI-LAYERED SPHERE
DOI, O
OHTSUKI, A
BULLETIN OF THE JSME-JAPAN SOCIETY OF MECHANICAL ENGINEERS, 1976, 19 (127): : 15 - 21
[32] THE X-RAY SPECTRAL MICROANALYSIS OF THE SURFACE-LAYERS OF SOLIDS
BERNER, AI
GIMELFARB, FA
KOSTYLEVA, OP
TARASOV, VK
INDUSTRIAL LABORATORY, 1981, 47 (09): : 934 - 940
[33] ON X-RAY MEASUREMENTS OF RESIDUAL-STRESSES IN MATERIALS WITH LATTICE STRAIN GRADIENT
KRAUS, I
GOSMANOVA, G
CZECHOSLOVAK JOURNAL OF PHYSICS, 1989, 39 (07) : 751 - 756
[34] X-RAY-DIFFRACTION ANALYSIS OF NITROGEN IMPLANTED SURFACE-LAYERS OF IRON AND STEEL
LING, GW
ZHANG, XZ
LI, HD
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 1987, 22 (04): : 504 - 508
[35] X-RAY PHOTO-ELECTRON ANALYSIS OF SURFACE-LAYERS WITH COMPOSITION GRADIENTS
NEFEDOV, VI
SURFACE AND INTERFACE ANALYSIS, 1981, 3 (02) : 72 - 75
[36] X-ray diffraction methods for the evaluation of residual stresses in the surface layers with gradient structure
Betsofen, S. Ya.
MATERIALS SCIENCE, 2006, 42 (03) : 367 - 375
[37] X-RAY-MEASUREMENT OF RESIDUAL-STRESSES IN A PLATE WITH BOTH SURFACE DIFFRACTIONS UNDER SINGLE SURFACE REMOVAL OR BOTH SURFACE REMOVAL
DOI, O
IMURA, T
BULLETIN OF THE JSME-JAPAN SOCIETY OF MECHANICAL ENGINEERS, 1982, 25 (207): : 1378 - 1381
[38] X-ray diffraction methods for the evaluation of residual stresses in the surface layers with gradient structure
S. Ya. Betsofen
Materials Science, 2006, 42 : 367 - 375
[39] DETERMINATION OF RESIDUAL-STRESSES IN AUTOFRETTAGED STEEL TUBES BY NEUTRON AND X-RAY-DIFFRACTION
PINTSCHOVIUS, L
MACHERAUCH, E
SCHOLTES, B
MATERIALS SCIENCE AND ENGINEERING, 1986, 84 (1-2): : 163 - 170
[40] SPECIAL FEATURES OF X-RAY MEASUREMENTS OF RESIDUAL-STRESSES IN THIN TIN FILMS
BETSOFEN, SY
PETROV, LM
RUSSIAN METALLURGY, 1991, (01): : 182 - 188

← 1 2 3 4 5 →