CROSS-SECTIONAL SPECIMENS FOR TRANSMISSION ELECTRON-MICROSCOPY

被引：111

|

作者：

ABRAHAMS, MS ^{[1
]}

BUIOCCHI, CJ ^{[1
]}

机构：

[1] RCA LABS,PRINCETON,NJ 08540

来源：

JOURNAL OF APPLIED PHYSICS | 1974年 / 45卷 / 08期

关键词：

D O I：

10.1063/1.1663778

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

引用

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页码：3315 / 3316

页数：2

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