ANALYSIS OF THE ELECTRONIC-PROPERTIES OF COCRPT THIN-FILMS USING PARALLEL ELECTRON-ENERGY-LOSS SPECTROSCOPY (PEELS)

被引：3
|
作者：
GLIJER, P [1 ]
SIVERTSEN, JM [1 ]
JUDY, JH [1 ]
机构：
[1] UNIV MINNESOTA,CTR MICROMAGNET & INFORMAT TECHNOL,MINNEAPOLIS,MN 55455
来源：
JOURNAL OF APPLIED PHYSICS | 1994年 / 75卷 / 10期
关键词：
D O I：
10.1063/1.355435
中图分类号：
O59 [应用物理学];
学科分类号：
摘要：
The effects of the Pt content in CoCrPt thin films on the appearanace of the near-edge structure of the Cr and Co L2,3 absorption edges were studied using parallel electron energy loss spectroscopy (PEELS). These reflect local changes in the 3d band of the material. It was found that addition of Pt leads to local fluctuations in the 3d band occupancy in CoCrPt films which causes a decrease of the number of 3d electrons per Co atom. An increase of the L3 to L2 white lines intensities ratio on the L2,3 Co edge with Pt content probably indicates an increase of the magnitude of exchange interactions in the CoCrPt thin films.
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收藏
页码：6141 / 6143
页数：3
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