X-RAY-DIFFRACTION STUDIES OF THIN-FILMS AND MULTILAYER STRUCTURES

被引：65
作者：
SEGMULLER, A [1 ]
NOYAN, IC [1 ]
SPERIOSU, VS [1 ]
机构：
[1] IBM CORP,ALMADEN RES CTR,SAN JOSE,CA 95120
来源：
PROGRESS IN CRYSTAL GROWTH AND CHARACTERIZATION OF MATERIALS | 1989年 / 18卷
关键词：
D O I：
10.1016/0146-3535(89)90024-5
中图分类号：
O7 [晶体学];
学科分类号：
0702 ; 070205 ; 0703 ; 080501 ;
摘要：
引用
收藏
页码：21 / 66
页数：46
相关论文
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