COMPOSITION DEPTH INFORMATION FROM THE INELASTIC BACKGROUND SIGNAL IN XPS

被引：44
作者：
TOUGAARD, S
机构：
来源：
SURFACE SCIENCE | 1985年 / 162卷 / 1-3期
关键词：
D O I：
10.1016/0039-6028(85)90992-6
中图分类号：
O64 [物理化学（理论化学）、化学物理学];
学科分类号：
070304 ; 081704 ;
摘要：
引用
收藏
页码：875 / 885
页数：11
相关论文
共 25 条
[21]   CONCENTRATION DEPTH PROFILES BY XPS - A NEW APPROACH [J].
TOUGAARD, S ;
IGNATIEV, A .
SURFACE SCIENCE, 1983, 129 (2-3) :355-365
[22]   ELECTRON INELASTIC MEAN FREE PATHS AND ENERGY-LOSSES IN SOLIDS .2. ELECTRON-GAS STATISTICAL-MODEL [J].
TUNG, CJ ;
ASHLEY, JC ;
RITCHIE, RH .
SURFACE SCIENCE, 1979, 81 (02) :427-439
[23]  
WEHENKEL C, 1974, PHYS STATUS SOLIDI B, V64, P515, DOI 10.1002/pssb.2220640212
[24]   NEW QUANTITATIVE METHOD FOR ANALYSIS OF ENERGY-LOSS SPECTRA OBTAINED WITH FAST ELECTRONS SCATTERED IN FORWARD DIRECTION - APPLICATION TO STUDY OF NOBLE-METALS [J].
WEHENKEL, C .
JOURNAL DE PHYSIQUE, 1975, 36 (02) :199-213
[25]  
Wehner G.K., 1975, METHODS SURFACE ANAL, P5
123