COMPOSITION DEPTH INFORMATION FROM THE INELASTIC BACKGROUND SIGNAL IN XPS

被引：44
作者：
TOUGAARD, S
机构：
来源：
SURFACE SCIENCE | 1985年 / 162卷 / 1-3期
关键词：
D O I：
10.1016/0039-6028(85)90992-6
中图分类号：
O64 [物理化学（理论化学）、化学物理学];
学科分类号：
070304 ; 081704 ;
摘要：
引用
收藏
页码：875 / 885
页数：11
相关论文
共 25 条
[1]   DEPTH RESOLUTION OF SPUTTER PROFILING [J].
ANDERSEN, HH .
APPLIED PHYSICS, 1979, 18 (02) :131-140
[2]  
ANDERSEN HH, 1981, TOP APPL PHYS, V47, P145, DOI [10.1007/3540105212_9, DOI 10.1007/3540105212_9]
[3]   STRAGGLING AND PLASMON EXCITATION IN THE ENERGY-LOSS SPECTRA OF ELECTRONS TRANSMITTED THROUGH CARBON [J].
ASHLEY, JC ;
COWAN, JJ ;
RITCHIE, RH ;
ANDERSON, VE ;
HOELZL, J .
THIN SOLID FILMS, 1979, 60 (03) :361-370
[4]   MANY-ELECTRON SINGULARITY IN X-RAY PHOTOEMISSION AND X-RAY LINE SPECTRA FROM METALS [J].
DONIACH, S ;
SUNJIC, M .
JOURNAL OF PHYSICS PART C SOLID STATE PHYSICS, 1970, 3 (02) :285-&
[5]   THE EFFECTS OF ELASTIC BACKSCATTERING ON THE AUGER OR X-RAY PHOTOELECTRON-SPECTRA OF SOLIDS [J].
DWYER, VM ;
MATTHEW, JAD .
SURFACE SCIENCE, 1984, 143 (01) :57-83
[6]   DETERMINATION OF REDUCED THICKNESS D-LAMBDA OF THIN-LAYERS BY MEANS OF X-RAY PHOTOELECTRON-SPECTROSCOPY [J].
EBEL, MF .
JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA, 1978, 14 (04) :287-322
[7]  
Hofmann S., 1980, Surface and Interface Analysis, V2, P148, DOI 10.1002/sia.740020406
[8]  
JABLONSKI A, 1985, UNPUB SURFACE INTERF
[9]  
Landau L, 1944, J PHYS-USSR, V8, P201
[10]  
LINDHARD J, 1954, MAT FYS MEDD DAN VID, V28, P1
123