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ON THE DETERMINATION OF THE CARRIER CONCENTRATION IN LARGE-GRAIN POLYCRYSTALLINE INP, GAAS, AND GAP BY HALL-EFFECT MEASUREMENTS
被引:8
|
作者
:
SIEGEL, W
论文数:
0
引用数:
0
h-index:
0
机构:
Bergakademie Freiberg, Sektion, Physik, Freiberg, East Ger, Bergakademie Freiberg, Sektion Physik, Freiberg, East Ger
SIEGEL, W
KUHNEL, G
论文数:
0
引用数:
0
h-index:
0
机构:
Bergakademie Freiberg, Sektion, Physik, Freiberg, East Ger, Bergakademie Freiberg, Sektion Physik, Freiberg, East Ger
KUHNEL, G
SCHNEIDER, HA
论文数:
0
引用数:
0
h-index:
0
机构:
Bergakademie Freiberg, Sektion, Physik, Freiberg, East Ger, Bergakademie Freiberg, Sektion Physik, Freiberg, East Ger
SCHNEIDER, HA
机构
:
[1]
Bergakademie Freiberg, Sektion, Physik, Freiberg, East Ger, Bergakademie Freiberg, Sektion Physik, Freiberg, East Ger
来源
:
PHYSICA STATUS SOLIDI A-APPLIED RESEARCH
|
1985年
/ 87卷
/ 02期
关键词
:
CARRIER CONCENTRATION;
D O I
:
10.1002/pssa.2210870232
中图分类号
:
T [工业技术];
学科分类号
:
08 ;
摘要
:
引用
收藏
页码:673 / 681
页数:9
相关论文
共 1 条
[1]
HALL-EFFECT MEASUREMENTS ON FINE-GRAIN POLY-SI THIN-FILM TRANSISTORS MADE FROM LASER-IRRADIATED SPUTTER-DEPOSITED SI FILM
SERIKAWA, T
论文数:
0
引用数:
0
h-index:
0
机构:
NTT Applied Electronics Laboratories, Musashino-shi, Tokyo, 180, 3-9-11, Midori-cho
SERIKAWA, T
SHIRAI, S
论文数:
0
引用数:
0
h-index:
0
机构:
NTT Applied Electronics Laboratories, Musashino-shi, Tokyo, 180, 3-9-11, Midori-cho
SHIRAI, S
OKAMOTO, A
论文数:
0
引用数:
0
h-index:
0
机构:
NTT Applied Electronics Laboratories, Musashino-shi, Tokyo, 180, 3-9-11, Midori-cho
OKAMOTO, A
SUYAMA, S
论文数:
0
引用数:
0
h-index:
0
机构:
NTT Applied Electronics Laboratories, Musashino-shi, Tokyo, 180, 3-9-11, Midori-cho
SUYAMA, S
JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS & EXPRESS LETTERS,
1991,
30
(2A):
: L172
-
L174
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