ELECTRON-IRRADIATION INDUCED CORROSION OF SILICON

被引:9
作者
FLOWER, HM [1 ]
SWANN, PR [1 ]
机构
[1] UNIV LONDON,IMPERIAL COLL SCI & TECHNOL,DEPT MET & MAT SCI,LONDON SW7 2BP,ENGLAND
关键词
D O I
10.1016/0010-938X(77)90055-5
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
引用
收藏
页码:305 / 315
页数:11
相关论文
共 11 条
[1]   INSITU STUDY OF TITANIUM OXIDATION BY HIGH-VOLTAGE ELECTRON-MICROSCOPY [J].
FLOWER, HM ;
SWANN, PR .
ACTA METALLURGICA, 1974, 22 (11) :1339-1347
[2]  
GRUBB DT, 1972, 5TH P EUR C EL MICR, P554
[3]  
ILER RK, 1973, SURF COLLOID SCI, V6, P1
[4]  
LAIDLER JJ, 1975, PHYSICAL ASPECTS ELE, P102
[5]  
LORIMER G, 1974, HIGH VOLTAGE ELECTRO, P301
[6]   An Introduction to High-Voltage Electron Microscopy [J].
Makin, M. J. ;
Sharp, J. V. .
JOURNAL OF MATERIALS SCIENCE, 1968, 3 (04) :360-371
[7]  
MAKIN MJ, 1971, JKA-JERNKONTORET ANN, V155, P509
[8]   RADIATION COMPACTION OF VITREOUS SILICA [J].
PRIMAK, W ;
KAMPWIRTH, R .
JOURNAL OF APPLIED PHYSICS, 1968, 39 (12) :5651-+
[9]  
SWANN PR, 1971, JERNKONT ANN, V155, P297
[10]  
TIGHE NJ, 1973, EOOAR690067 USAF CON