TEMPERATURE-DEPENDENT RESISTIVITY MEASUREMENTS ON POLYCRYSTALLINE SIO2-COVERED THIN NICKEL FILMS

被引：17
作者：
DEVRIES, JWC
机构：
来源：
THIN SOLID FILMS | 1987年 / 150卷 / 2-3期
关键词：
D O I：
10.1016/0040-6090(87)90092-7
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
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页码：209 / 215
页数：7
相关论文
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