THE PLASMA-ETCHING OF ELECTRONIC MATERIALS

被引:0
作者
MANTEI, TD
机构
来源
JOM-JOURNAL OF THE MINERALS METALS & MATERIALS SOCIETY | 1994年 / 46卷 / 03期
关键词
D O I
暂无
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Microelectronic fabrication requires the repeated use of etching processes in a variety of materials to delineate fine-scale circuit features with submicrometer dimensions. Plasma-assisted etching combines chemical etching by reactive neutral gas phase species with bombardment by charged plasma ions to form volatile final etch products. This ion-neutral interaction makes possible highly directional etching in semiconductors, metals, polymers, and dielectrics, with satisfactory etch rates and process yields.
引用
收藏
页码:36 / 39
页数:4
相关论文
共 25 条
[1]   SURFACE STUDIES OF AND A MASS BALANCE MODEL FOR AR+ ION-ASSISTED CL-2 ETCHING OF SI [J].
BARKER, RA ;
MAYER, TM ;
PEARSON, WC .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1983, 1 (01) :37-42
[2]  
Chapman B., 1980, GLOW DISCHARGE PROCE, P297
[3]  
CHEN FF, 1984, INTRO PLASMA PHYSICS, V1, P1
[4]   ION-ASSISTED AND ELECTRON-ASSISTED GAS-SURFACE CHEMISTRY - IMPORTANT EFFECT IN PLASMA-ETCHING [J].
COBURN, JW ;
WINTERS, HF .
JOURNAL OF APPLIED PHYSICS, 1979, 50 (05) :3189-3196
[5]   INSITU AUGER-ELECTRON SPECTROSCOPY OF SI AND SIO2 SURFACES PLASMA ETCHED IN CF4-H2 GLOW-DISCHARGES [J].
COBURN, JW .
JOURNAL OF APPLIED PHYSICS, 1979, 50 (08) :5210-5213
[6]  
COBURN JW, 1982, PLASMA ETCHING REACT, pCH4
[7]   APPLICATION OF ELECTRON-PARAMAGNETIC-RES SPECTROSCOPY TO OXIDATIVE REMOVAL OF ORGANIC MATERIALS [J].
COOK, JM ;
BENSON, BW .
JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1983, 130 (12) :2459-2464
[8]  
Flamm D.L., 1981, PLASMA CHEM PLASMA P, V1, P317, DOI [10.1007/bf00565992, DOI 10.1007/BF00565992]
[9]   THE REACTION OF FLUORINE-ATOMS WITH SILICON [J].
FLAMM, DL ;
DONNELLY, VM ;
MUCHA, JA .
JOURNAL OF APPLIED PHYSICS, 1981, 52 (05) :3633-3639
[10]  
FLAMM DL, 1989, PLASMA ETCHING INTRO, P144