HIGH-RESOLUTION X-RAY SPECTROSCOPY USING SYNCHROTRON RADIATION - SOURCE CHARACTERISTICS AND OPTICAL SYSTEMS

被引：22
作者：
PIANETTA, P
LINDAU, I
机构：
[1] STANFORD UNIV,STANFORD ELECTR LABS,STANFORD,CA 94305
[2] STANFORD UNIV,STANFORD SYNCHROTRON RADIAT PROJECT,STANFORD,CA 94305
来源：
JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA | 1977年 / 11卷 / 01期
关键词：
D O I：
10.1016/0368-2048(77)85046-9
中图分类号：
O433 [光谱学];
学科分类号：
0703 ; 070302 ;
摘要：
引用
收藏
页码：13 / 38
页数：26
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