PULSED OVERLOAD TOLERANCE OF SI-CR, NI-CR AND MO-SI THIN-FILM RESISTORS ON INTEGRATED-CIRCUITS

被引：0
作者：
KEENAN, WF [1 ]
机构：
[1] TEXAS INSTR INC,DALLAS,TX 75222
来源：
IEEE TRANSACTIONS ON RELIABILITY | 1976年 / 25卷 / 04期
关键词：
D O I：
10.1109/TR.1976.5219983
中图分类号：
TP3 [计算技术、计算机技术];
学科分类号：
0812 ;
摘要：
引用
收藏
页码：248 / 254
页数：7
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