PULSED OVERLOAD TOLERANCE OF SI-CR, NI-CR AND MO-SI THIN-FILM RESISTORS ON INTEGRATED-CIRCUITS

被引：0
作者：
KEENAN, WF [1 ]
机构：
[1] TEXAS INSTR INC,DALLAS,TX 75222
来源：
IEEE TRANSACTIONS ON RELIABILITY | 1976年 / 25卷 / 04期
关键词：
D O I：
10.1109/TR.1976.5219983
中图分类号：
TP3 [计算技术、计算机技术];
学科分类号：
0812 ;
摘要：
引用
收藏
页码：248 / 254
页数：7
相关论文
共 50 条
  • [21] PHASE FORMATION IN CR-SI THIN-FILM INTERACTIONS
    COLGAN, EG
    TSAUR, BY
    MAYER, JW
    APPLIED PHYSICS LETTERS, 1980, 37 (10) : 938 - 940
  • [22] The effect of microstructures on the electrical properties of Cr-Si-C thin film resistors
    Ito, Nozomi
    Maekawa, Kazuyoshi
    Kunimune, Yorinobu
    Hasegawa, Eiji
    Abe, Kenichiro
    Shiraishi, Nobuhito
    Takahashi, Yuji
    Tonegawa, Takashi
    Tsuchiya, Yasuaki
    Inoue, Masao
    JAPANESE JOURNAL OF APPLIED PHYSICS, 2022, 61 (SJ)
  • [23] TERNARY ALLOY-FILMS OF NI-CR-AL FOR THIN-FILM RESISTORS
    SCHIPPEL, E
    THIN SOLID FILMS, 1987, 146 (02) : 133 - 138
  • [24] Comparative analysis of Ni-Cr/Pt thin film resistors on silicon and GaAs substrates for EPD technology
    Wang, Cong
    Kim, Nam-Young
    INDIAN JOURNAL OF ENGINEERING AND MATERIALS SCIENCES, 2012, 19 (05) : 304 - 306
  • [25] A Study of Thin Film Resistors Prepared Using Ni-Cr-Si-Al-Ta High Entropy Alloy
    Lin, Ruei-Cheng
    Lee, Tai-Kuang
    Wu, Der-Ho
    Lee, Ying-Chieh
    ADVANCES IN MATERIALS SCIENCE AND ENGINEERING, 2015, 2015
  • [26] INTERACTIONS OF THIN AL FILMS WITH NI-CR ALLOY AND BILAYER FILMS DEPOSITED ON SI
    RATNER, E
    APPELBAUM, A
    BRENER, R
    EIZENBERG, M
    PHYSICA STATUS SOLIDI A-APPLIED RESEARCH, 1986, 94 (01): : 61 - 69
  • [27] Precision Thin Film Resistors Based on Ni-Cr Quinternary Alloy Thin Films Prepared by Magnetron Sputtering Technique
    Lee, Boong-Joo
    Lee, Sunwoo
    Shin, Paik-Kyun
    JAPANESE JOURNAL OF APPLIED PHYSICS, 2009, 48 (05) : 0555021 - 0555025
  • [28] RESISTANCE STABILITY OF AULN2 THIN-FILM RESISTORS FOR PB-ALLOY JOSEPHSON INTEGRATED-CIRCUITS
    HASUMI, Y
    ARAI, K
    WAHO, T
    YANAGAWA, F
    JOURNAL OF APPLIED PHYSICS, 1985, 57 (01) : 96 - 101
  • [29] MAGNETIC AND RECORDING CHARACTERISTICS OF CO-CR-TA/CR THIN-FILM PREPARED ON SI SUBSTRATE
    KAWANABE, T
    PARK, JG
    NAOE, M
    IEEE TRANSACTIONS ON MAGNETICS, 1991, 27 (06) : 5031 - 5033
  • [30] STUDIES OF A HIGH ACCURACY NI-CR-SI THIN-FILM RESISTOR FOR PCM-120 SYSTEM
    KANEOYA, R
    MATSUMOTO, T
    MORIYA, K
    JINNO, T
    REVIEW OF THE ELECTRICAL COMMUNICATIONS LABORATORIES, 1974, 22 (1-2): : 82 - 91
12345