DETERMINATION OF EPITAXIC-LAYER COMPOSITION AND THICKNESS BY DOUBLE-CRYSTAL X-RAY-DIFFRACTION

被引：28
作者：
BASSIGNANA, IC
TAN, CC
机构：
来源：
JOURNAL OF APPLIED CRYSTALLOGRAPHY | 1989年 / 22卷
关键词：
D O I：
10.1107/S0021889888014773
中图分类号：
O6 [化学];
学科分类号：
0703 ;
摘要：
引用
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页码：269 / 276
页数：8
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