DETERMINATION OF EPITAXIC-LAYER COMPOSITION AND THICKNESS BY DOUBLE-CRYSTAL X-RAY-DIFFRACTION

被引：28

作者：

BASSIGNANA, IC

TAN, CC

机构：

来源：

JOURNAL OF APPLIED CRYSTALLOGRAPHY | 1989年 / 22卷

关键词：

D O I：

10.1107/S0021889888014773

中图分类号：

O6 [化学];

学科分类号：

0703 ;

摘要：

引用

收藏

页码：269 / 276

页数：8

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