CARBON-TETRACHLORIDE PLASMA-ETCHING OF GAAS AND INP - A KINETIC-STUDY UTILIZING NONPERTURBATIVE OPTICAL TECHNIQUES

被引:64
作者
GOTTSCHO, RA
SMOLINSKY, G
BURTON, RH
机构
关键词
D O I
10.1063/1.331433
中图分类号
O59 [应用物理学];
学科分类号
摘要
引用
收藏
页码:5908 / 5919
页数:12
相关论文
共 46 条
[31]   EVALUATION OF ULTRATHIN NATIVE OXIDE ON GAAS SURFACE [J].
SAKAI, I ;
HIROSE, M ;
OSAKA, Y .
JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1980, 127 (03) :713-716
[32]  
SAUNDERS RA, 1969, INT J MASS SPECTROM, V3, P203
[33]   PREFERENTIAL LATERAL CHEMICAL ETCHING IN REACTIVE ION ETCHING OF ALUMINUM AND ALUMINUM-ALLOYS [J].
SCHAIBLE, PM ;
SCHWARTZ, GC .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY, 1979, 16 (02) :377-380
[34]   REACTIVE ION ETCHING OF ALUMINUM AND ALUMINUM-ALLOYS IN AN RF PLASMA CONTAINING HALOGEN SPECIES [J].
SCHAIBLE, PM ;
METZGER, WC ;
ANDERSON, JP .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY, 1978, 15 (02) :334-337
[35]   DISSOCIATIVE ELECTRON-ATTACHMENT TO CCL4, CHCL3, CH2CL2 AND CH3CL [J].
SCHEUNEMANN, HU ;
ILLENBERGER, E ;
BAUMGARTEL, H .
BERICHTE DER BUNSEN-GESELLSCHAFT-PHYSICAL CHEMISTRY CHEMICAL PHYSICS, 1980, 84 (06) :580-585
[36]  
SCHWARTZ GC, 1980, SOLID STATE TECHNOL, V23, P85
[37]  
SHIMODA K, 1976, HIGH RESOLUTION LASE, P17
[38]   PLASMA-ETCHING OF III-V-COMPOUND SEMICONDUCTOR-MATERIALS AND THEIR OXIDES [J].
SMOLINSKY, G ;
CHANG, RP ;
MAYER, TM .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY, 1981, 18 (01) :12-16
[39]   LASER-INDUCED FLUORESCENCE-SPECTRUM OF ARGON MATRIX-ISOLATED DICHLOROCARBENE [J].
TEVAULT, DE ;
ANDREWS, L .
JOURNAL OF MOLECULAR SPECTROSCOPY, 1975, 54 (01) :110-120
[40]   LASER-INDUCED FLUORESCENCE EXCITATION-SPECTRA OF CCL2 AND CFCL RADICALS IN THE GAS-PHASE [J].
TIEE, JJ ;
WAMPLER, FB ;
RICE, WW .
CHEMICAL PHYSICS LETTERS, 1979, 65 (03) :425-428