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CARBON-TETRACHLORIDE PLASMA-ETCHING OF GAAS AND INP - A KINETIC-STUDY UTILIZING NONPERTURBATIVE OPTICAL TECHNIQUES
被引:64
|
作者
:
GOTTSCHO, RA
论文数:
0
引用数:
0
h-index:
0
GOTTSCHO, RA
SMOLINSKY, G
论文数:
0
引用数:
0
h-index:
0
SMOLINSKY, G
BURTON, RH
论文数:
0
引用数:
0
h-index:
0
BURTON, RH
机构
:
来源
:
JOURNAL OF APPLIED PHYSICS
|
1982年
/ 53卷
/ 08期
关键词
:
D O I
:
10.1063/1.331433
中图分类号
:
O59 [应用物理学];
学科分类号
:
摘要
:
引用
收藏
页码:5908 / 5919
页数:12
相关论文
共 6 条
[1]
CARBON TETRACHLORIDE PLASMA ETCHING OF GaAs AND InP: A KINETIC STUDY UTILIZING NONPERTURBATIVE OPTICAL TECHNIQUES.
Gottscho, Richard A.
论文数:
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引用数:
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h-index:
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机构:
Bell Laboratories, Murray Hill, NJ 07974, United States
Bell Laboratories, Murray Hill, NJ 07974, United States
Gottscho, Richard A.
Smolinsky, Gerald
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Bell Laboratories, Murray Hill, NJ 07974, United States
Bell Laboratories, Murray Hill, NJ 07974, United States
Smolinsky, Gerald
Burton, Randolph H.
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Bell Laboratories, Murray Hill, NJ 07974, United States
Bell Laboratories, Murray Hill, NJ 07974, United States
Burton, Randolph H.
1600,
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[2]
PLASMA-ETCHING OF ALUMINUM FILMS IN CARBON-TETRACHLORIDE
TOKUNAGA, K
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UNIV CALIF BERKELEY,DEPT CHEM ENGN,BERKELEY,CA 94720
UNIV CALIF BERKELEY,DEPT CHEM ENGN,BERKELEY,CA 94720
TOKUNAGA, K
HESS, DW
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UNIV CALIF BERKELEY,DEPT CHEM ENGN,BERKELEY,CA 94720
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HESS, DW
JOURNAL OF THE ELECTROCHEMICAL SOCIETY,
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[3]
OPTICAL-EMISSION SPECTROSCOPY OF PLASMA-ETCHING OF GAAS AND INP
LAW, VJ
论文数:
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引用数:
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机构:
Cavendish Laboratory, University of Cambridge, Cambridge, CB3 OHE, Madingley Road
LAW, VJ
JONES, GAC
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Cavendish Laboratory, University of Cambridge, Cambridge, CB3 OHE, Madingley Road
JONES, GAC
RITCHIE, DA
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Cavendish Laboratory, University of Cambridge, Cambridge, CB3 OHE, Madingley Road
RITCHIE, DA
TEWORDT, M
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TEWORDT, M
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[4]
A KINETIC-STUDY OF THE PLASMA-ETCHING PROCESS .2. PROBE MEASUREMENTS OF ELECTRON PROPERTIES IN AN RF PLASMA-ETCHING REACTOR
KUSHNER, MJ
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机构:
SANDIA NATL LABS,DIV 4216,ALBUQUERQUE,NM 87185
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[5]
KINETIC-STUDY OF THE REACTION BETWEEN MOLYBDENUM TRIOXIDE AND GASEOUS CARBON-TETRACHLORIDE
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RIVAROLA, JB
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A KINETIC-STUDY OF THE PLASMA-ETCHING PROCESS .1. A MODEL FOR THE ETCHING OF SI AND SIO2 IN CNFM/H2 AND CNFM/O2 PLASMAS
KUSHNER, MJ
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机构:
SANDIA NATL LABS, DIV 4216, ALBUQUERQUE, NM 87185 USA
SANDIA NATL LABS, DIV 4216, ALBUQUERQUE, NM 87185 USA
KUSHNER, MJ
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