HISTORICAL DEVELOPMENT AND PRINCIPLES OF TOTAL REFLECTION X-RAY-FLUORESCENCE ANALYSIS (TXRF)

The historical development of the physical knowledge and the practical application of total reflection X-ray fluorescence analysis (TXRF) is outlined in the introduction. The basic principles of TXRF determining physics and geometry of total-reflection sample support, total-reflection high energy cut-off filters and recent theoretical developments are described together with the principal instrumental developments and the important meeting which stimulated the development and distribution of TXRF.