A PREPARATION METHOD FOR OBSERVING INTRACELLULAR STRUCTURES BY SCANNING ELECTRON-MICROSCOPY

被引：177

作者：

TANAKA, K

MITSUSHIMA, A

机构：

来源：

关键词：

D O I：

10.1111/j.1365-2818.1984.tb00487.x

中图分类号：

TH742 [显微镜];

学科分类号：

摘要：

引用

页码：213 / 222

页数：10

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[2]

BECKER RP, 1976, SCANNING ELECTRON MI, V2, P171

[3]

DENEE PB, 1977, SCANNING ELECTRON MI, V2, P83

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GOMORI, G .

STAIN TECHNOLOGY, 1950, 25 (02) :81-85

[5] FREEZE-FRACTURE FOR SCANNING ELECTRON-MICROSCOPY [J].

HAGGIS, GH ;

PHIPPSTODD, B .

JOURNAL OF MICROSCOPY-OXFORD, 1977, 111 (NOV) :193-201

HAGGIS, GH ;

BOND, EF .

[7]

Haggis GH, 1970, SCANNING ELECTRON MI, P99

[8]

Humphreys WJ, 1974, SCANNING ELECTRON MI, P275

[9]

HUMPHREYS WJ, 1979, SCANNING ELECTRON MI, V2, P345

[10]

INAGA K, 1983, J YONAGO MED ASSOC, V34, P44