ELECTRONIC-STRUCTURE OF SIO2, SIXGE1-XO2, AND GEO2 FROM PHOTOEMISSION SPECTROSCOPY

被引：105

作者：

FISCHER, B ^{[1
]}

POLLAK, RA ^{[1
]}

DISTEFANO, TH ^{[1
]}

GROBMAN, WD ^{[1
]}

机构：

[1] IBM CORP, THOMAS J WATSON RES CTR, YORKTOWN HTS, NY 10598 USA

来源：

PHYSICAL REVIEW B | 1977年 / 15卷 / 06期

关键词：

D O I：

10.1103/PhysRevB.15.3193

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

引用

页码：3193 / 3199

页数：7

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