APPLICATIONS OF LOW-TEMPERATURE SCANNING ELECTRON-MICROSCOPY

被引：62
作者：
HUEBENER, RP
机构：
来源：
REPORTS ON PROGRESS IN PHYSICS | 1984年 / 47卷 / 02期
关键词：
D O I：
10.1088/0034-4885/47/2/002
中图分类号：
O4 [物理学];
学科分类号：
0702 ;
摘要：
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页码：175 / 220
页数：46
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