EXPONENTIATED WEIBULL FAMILY FOR ANALYZING BATHTUB FAILURE-RATE DATA

被引：764
|
作者：
MUDHOLKAR, GS
SRIVASTAVA, DK
机构：
[1] University of Rochester, Rochester
来源：
IEEE TRANSACTIONS ON RELIABILITY | 1993年 / 42卷 / 02期
关键词：
LIFETIME DATA; TOTAL TIME ON TEST; MAXIMUM LIKELIHOOD; GOODNESS OF FIT;
D O I：
10.1109/24.229504
中图分类号：
TP3 [计算技术、计算机技术];
学科分类号：
0812 ;
摘要：
A simple generalization of the Weibull distribution offered here is well suited for modeling bathtub failure rate lifetime data and for testing goodness-of-fit of the Weibull and negative exponential models as subhypotheses.
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页码：299 / 302
页数：4
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