THE FUNDAMENTAL ABSORPTION-EDGE IN BI12SIO20

[11] IMAGING CHARACTERISTICS OF ITEK PROM [J]. APPLIED OPTICS, 1974, 13 (09): : 2052 - 2060

[12] MARIE G, 1974, ADV IMAGE PICKUP DIS, V1

[13] Pankove J. I, 1971, OPTICAL PROCESSES SE

[14] SVENSSON C, 1979, ACTA CRYSTALLOGR B, V35, P2678

[15] CZOCHRALSKI GROWTH OF OPTICAL QUALITY BISMUTH SILICON-OXIDE (BI12SIO20) [J]. JOURNAL OF CRYSTAL GROWTH, 1977, 42 (DEC) : 431 - 434

[11] IMAGING CHARACTERISTICS OF ITEK PROM [J]. APPLIED OPTICS, 1974, 13 (09): : 2052 - 2060

[12] MARIE G, 1974, ADV IMAGE PICKUP DIS, V1

[13] Pankove J. I, 1971, OPTICAL PROCESSES SE

[14] SVENSSON C, 1979, ACTA CRYSTALLOGR B, V35, P2678

[15] CZOCHRALSKI GROWTH OF OPTICAL QUALITY BISMUTH SILICON-OXIDE (BI12SIO20) [J]. JOURNAL OF CRYSTAL GROWTH, 1977, 42 (DEC) : 431 - 434