IMPROVED SOLID-STATE NOISE SOURCE

[1] STATISTICS OF ATOMIC FREQUENCY STANDARDS [J]. PROCEEDINGS OF THE INSTITUTE OF ELECTRICAL AND ELECTRONICS ENGINEERS, 1966, 54 (02): : 221 - &

[2] CHARACTERIZATION OF FREQUENCY STABILITY [J]. IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, 1971, IM20 (02) : 105 - +

[3] NOISE OF A SELF-SUSTAINING AVALANCHE DISCHARGE IN SILICON - STUDIES AT MICROWAVE FREQUENCIES [J]. JOURNAL OF APPLIED PHYSICS, 1968, 39 (07) : 3379 - &

[4] NOISE THEORY FOR READ TYPE AVALANCHE DIODE [J]. IEEE TRANSACTIONS ON ELECTRON DEVICES, 1966, ED13 (01) : 158 - &

[5] Kanda Motohisa, 1975, 1975 IEEE-MTT-S International Microwave Symposium, P315

[6] KANDA M, TO BE PUBLISHED

[7] MOLL JL, 1964, PHYSICS SEMICONDUCTR

[8] SHOAF JH, 1973, NBS632 TECHN NOT

[9] PROBLEMS RELATED TO P-N JUNCTIONS IN SILICON [J]. SOLID-STATE ELECTRONICS, 1961, 2 (01) : 35 - +

[1] STATISTICS OF ATOMIC FREQUENCY STANDARDS [J]. PROCEEDINGS OF THE INSTITUTE OF ELECTRICAL AND ELECTRONICS ENGINEERS, 1966, 54 (02): : 221 - &

[2] CHARACTERIZATION OF FREQUENCY STABILITY [J]. IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, 1971, IM20 (02) : 105 - +

[3] NOISE OF A SELF-SUSTAINING AVALANCHE DISCHARGE IN SILICON - STUDIES AT MICROWAVE FREQUENCIES [J]. JOURNAL OF APPLIED PHYSICS, 1968, 39 (07) : 3379 - &

[4] NOISE THEORY FOR READ TYPE AVALANCHE DIODE [J]. IEEE TRANSACTIONS ON ELECTRON DEVICES, 1966, ED13 (01) : 158 - &

[5] Kanda Motohisa, 1975, 1975 IEEE-MTT-S International Microwave Symposium, P315

[6] KANDA M, TO BE PUBLISHED

[7] MOLL JL, 1964, PHYSICS SEMICONDUCTR

[8] SHOAF JH, 1973, NBS632 TECHN NOT

[9] PROBLEMS RELATED TO P-N JUNCTIONS IN SILICON [J]. SOLID-STATE ELECTRONICS, 1961, 2 (01) : 35 - +