CONCENTRATION PROFILES FOR IRREGULAR SURFACES FROM X-RAY PHOTOELECTRON ANGULAR-DISTRIBUTIONS

被引：38
作者：
BAIRD, RJ
FADLEY, CS
KAWAMOTO, SK
MEHTA, M
ALVAREZ, R
SILVA, JA
机构：
[1] UNIV HAWAII,DEPT CHEM,HONOLULU,HI 96822
[2] UNIV HAWAII,DEPT AGRON & SOIL SCI,HONOLULU,HI 96822
来源：
ANALYTICAL CHEMISTRY | 1976年 / 48卷 / 06期
关键词：
D O I：
10.1021/ac60370a013
中图分类号：
O65 [分析化学];
学科分类号：
070302 ; 081704 ;
摘要：
引用
收藏
页码：843 / 846
页数：4
相关论文
共 14 条
[1]  
ALVAREZ R, UNPUBLISHED RESULTS
[2]  
ALVAREZ R, 1975, THESIS U HAWAII
[3]   DIRECT OBSERVATION OF SURFACE-PROFILE EFFECTS ON X-RAY-PHOTOELECTRON ANGULAR-DISTRIBUTIONS [J].
BAIRD, RJ ;
FADLEY, CS ;
KAWAMOTO, S ;
MEHTA, M .
CHEMICAL PHYSICS LETTERS, 1975, 34 (01) :49-54
[4]  
BAIRD RJ, 1975, 30TH NW REG M ACS HO
[5]   THEORY OF FORMATION OF VERY THIN OXIDE FILMS ON METALS [J].
BOGGIO, JE ;
PLUMB, RC .
JOURNAL OF CHEMICAL PHYSICS, 1966, 44 (03) :1081-&
[6]  
BRUNNER J, 1974, J ELECTRON SPECTROSC, V5, P811
[7]   SURFACE ANALYSIS AND ANGULAR-DISTRIBUTIONS IN X-RAY PHOTOELECTRON-SPECTROSCOPY [J].
FADLEY, CS ;
BAIRD, RJ ;
SIEKHAUS, W ;
NOVAKOV, T ;
BERGSTROM, SA .
JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA, 1974, 4 (02) :93-137
[8]   ANGULAR DISTRIBUTION OF PHOTOELECTRONS FROM A METAL SINGLE CRYSTAL [J].
FADLEY, CS ;
BERGSTROM, SA .
PHYSICS LETTERS A, 1971, A 35 (05) :375-+
[9]   INSTRUMENTATION FOR SURFACE STUDIES - XPS ANGULAR-DISTRIBUTIONS [J].
FADLEY, CS .
JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA, 1974, 5 (NOV-D) :725-754
[10]  
FADLEY CS, 1972, ELECTRON SPECTROSCOP, P233
12