SECONDARY ION MASS-SPECTROMETRY BY TIME-OF-FLIGHT

被引：28
作者：
STANDING, KG
BEAVIS, R
ENS, W
SCHUELER, B
机构：
来源：
INTERNATIONAL JOURNAL OF MASS SPECTROMETRY AND ION PROCESSES | 1983年 / 53卷 / SEP期
关键词：
D O I：
10.1016/0020-7381(83)85107-9
中图分类号：
O64 [物理化学（理论化学）、化学物理学]; O56 [分子物理学、原子物理学];
学科分类号：
070203 ; 070304 ; 081704 ; 1406 ;
摘要：
引用
收藏
页码：125 / 134
页数：10
相关论文
共 50 条
  • [41] Time-of-flight secondary ion mass spectrometry of industrial materials
    Keller, BA
    Hug, P
    ANALYTICA CHIMICA ACTA, 1999, 393 (1-3) : 201 - 212
  • [42] Organic microanalysis by time-of-flight secondary ion mass spectrometry
    Sjovall, Peter
    GEOCHIMICA ET COSMOCHIMICA ACTA, 2007, 71 (15) : A944 - A944
  • [43] Time-of-flight secondary ion mass spectrometry analyses of vancomycin
    Du, Lin
    Yang, Xiaohui
    Li, Wenqiang
    Li, Haoying
    Feng, Shanbao
    Zeng, Rong
    Yu, Bin
    Xiao, Liangxing
    Liu, Yu
    Tu, Mei
    Nie, Heng-Yong
    BIOINTERPHASES, 2018, 13 (03)
  • [44] THE KINETICS OF A SURFACE-CHEMICAL REACTION - A TIME-OF-FLIGHT SECONDARY ION MASS-SPECTROMETRY STUDY
    VANVELZEN, PNT
    PONJEE, JJ
    BENNINGHOVEN, A
    APPLIED SURFACE SCIENCE, 1989, 37 (02) : 147 - 159
  • [45] ULTRA-SHALLOW DEPTH PROFILING WITH TIME-OF-FLIGHT SECONDARY-ION MASS-SPECTROMETRY
    BENNETT, J
    DAGATA, JA
    JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1994, 12 (01): : 214 - 218
  • [46] DIRECT QUANTITATION OF ALKYLKETENE DIMERS USING TIME-OF-FLIGHT SECONDARY-ION MASS-SPECTROMETRY
    ZIMMERMAN, PA
    HERCULES, DM
    LOOS, WO
    ANALYTICAL CHEMISTRY, 1995, 67 (17) : 2901 - 2905
  • [47] RESOLUTION OF TIME-OF-FLIGHT MASS SPECTROMETERS EVALUATED FOR SECONDARY NEUTRAL MASS-SPECTROMETRY
    KATO, M
    MOGAMI, A
    NAITO, M
    ICHIMURA, S
    SHIMIZU, H
    REVIEW OF SCIENTIFIC INSTRUMENTS, 1988, 59 (09) : 1947 - 1950
  • [48] ADVANCES IN POLYMER SURFACE CHARACTERIZATION USING TIME-OF-FLIGHT SECONDARY-ION MASS-SPECTROMETRY
    LEE, JJ
    LINDLEY, PM
    REICH, DF
    ABSTRACTS OF PAPERS OF THE AMERICAN CHEMICAL SOCIETY, 1993, 206 : 5 - POLY
  • [49] QUANTIFICATION OF ENDGROUP FUNCTIONALIZATION USING TIME-OF-FLIGHT STATIC SECONDARY-ION MASS-SPECTROMETRY
    BELU, AM
    HUNT, MO
    DESIMONE, JM
    LINTON, RW
    ABSTRACTS OF PAPERS OF THE AMERICAN CHEMICAL SOCIETY, 1993, 206 : 45 - POLY
  • [50] ASSESSMENT OF PHOTOOXIDATION IN MULTILAYER COATING SYSTEMS BY TIME-OF-FLIGHT SECONDARY-ION MASS-SPECTROMETRY
    GERLOCK, JL
    PRATER, TJ
    KABERLINE, SL
    DEVRIES, JE
    POLYMER DEGRADATION AND STABILITY, 1995, 47 (03) : 405 - 411
12345