IONIZING-RADIATION EFFECTS IN SOS STRUCTURES

被引：5

|

作者：

NEAMEN, D ^{[1
]}

BUCHANAN, B ^{[1
]}

SHEDD, W ^{[1
]}

机构：

[1] USAF,SYST COMMAND,CAMBRIDGE RES LABS,BEDFORD,MA 01730

来源：

IEEE TRANSACTIONS ON NUCLEAR SCIENCE | 1975年 / 22卷 / 06期

关键词：

D O I：

10.1109/TNS.1975.4328105

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

收藏

页码：2197 / 2202

页数：6

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