DEWETTING AND SLIPPAGE OF MICROSCOPIC POLYMER-FILMS

被引:165
作者
REDON, C [1 ]
BRZOSKA, JB [1 ]
BROCHARDWYART, F [1 ]
机构
[1] INST CURIE, PHYS & CHIM SECT, F-75231 PARIS 05, FRANCE
关键词
D O I
10.1021/ma00080a021
中图分类号
O63 [高分子化学(高聚物)];
学科分类号
070305 ; 080501 ; 081704 ;
摘要
Films of poly(dimethylsiloxane) deposited on silanized silicon wafers are unstable and dewet by nucleation and growth of dry patches. We have monitored the growth of holes: (i) In thick films (that is, for film thicknesses, e, larger than 10 mu m), holes open at constant velocity. The radius of the dry patch, R, grows linearly with time, t. (ii) In microscopic films (e < 1 mu m), we find R(t) similar to t(0.66+/-0.08). We interpret this result by a slippage of the polymer chains on the solid surface.
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收藏
页码:468 / 471
页数:4
相关论文
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