STRAINED QUANTUM-WELL VALENCE-BAND STRUCTURE AND OPTIMAL PARAMETERS FOR ALGAAS-INGAAS-ALGAAS P-CHANNEL FIELD-EFFECT TRANSISTORS

被引:23
作者
LAIKHTMAN, B [1 ]
KIEHL, RA [1 ]
FRANK, DJ [1 ]
机构
[1] IBM CORP, THOMAS J WATSON RES CTR, DIV RES, YORKTOWN HTS, NY 10598 USA
关键词
D O I
10.1063/1.349569
中图分类号
O59 [应用物理学];
学科分类号
摘要
Using the model of an infinite well we have performed detailed calculations of the valence-band structure and for the first time obtained analytic expressions for wave functions in a strained quantum well. In-plane effective masses and energy separations are calculated for different thicknesses of InGaAs wells and In mole fractions in the range of 0-0.50. Based on the calculations we estimate the optimal thickness of the well and In mole fraction for which the energy separation between the lowest two subbands has a maximum and the InGaAs layer is stable with respect to misfit dislocations. The results provide useful guidelines for the optimization of strained p-channel field-effect transistors.
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页码:1531 / 1538
页数:8
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