ORGANIC SECONDARY ION MASS-SPECTROMETRY (SIMS) AND ITS RELATION TO FAST ATOM BOMBARDMENT (FAB)

被引：26
作者：
BENNINGHOVEN, A
机构：
来源：
INTERNATIONAL JOURNAL OF MASS SPECTROMETRY AND ION PROCESSES | 1983年 / 46卷 / JAN期
关键词：
D O I：
10.1016/0020-7381(83)80151-X
中图分类号：
O64 [物理化学（理论化学）、化学物理学]; O56 [分子物理学、原子物理学];
学科分类号：
070203 ; 070304 ; 081704 ; 1406 ;
摘要：
引用
收藏
页码：459 / 462
页数：4
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