ZERO-PHONON LINE ASSOCIATED WITH THE MIDGAP LEVEL EL2 IN GAAS - CORRELATION WITH THE ASGA ANTISITE DEFECT

被引:18
作者
TSUKADA, N [1 ]
KIKUTA, T [1 ]
ISHIDA, K [1 ]
机构
[1] OPTOELECTR JOINT RES LAB,KAWASAKI 211,JAPAN
来源
PHYSICAL REVIEW B | 1986年 / 33卷 / 12期
关键词
D O I
10.1103/PhysRevB.33.8859
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
引用
收藏
页码:8859 / 8862
页数:4
相关论文
共 24 条
[21]   PHOTOELECTRIC MEMORY EFFECT IN GAAS [J].
VINCENT, G ;
BOIS, D ;
CHANTRE, A .
JOURNAL OF APPLIED PHYSICS, 1982, 53 (05) :3643-3649
[22]   SUBMILLIMETER ELECTRON-PARAMAGNETIC-RES EVIDENCE FOR THE ARSENIC ANTISITE DEFECT IN GAAS [J].
WAGNER, RJ ;
KREBS, JJ ;
STAUSS, GH ;
WHITE, AM .
SOLID STATE COMMUNICATIONS, 1980, 36 (01) :15-17
[23]   IDENTIFICATION OF ASGA ANTISITES IN PLASTICALLY DEFORMED GAAS [J].
WEBER, ER ;
ENNEN, H ;
KAUFMANN, U ;
WINDSCHEIF, J ;
SCHNEIDER, J ;
WOSINSKI, T .
JOURNAL OF APPLIED PHYSICS, 1982, 53 (09) :6140-6143
[24]  
WOERNER R, 1982, APPL PHYS LETT, V40, P141