THERMALLY INDUCED OPTICAL BISTABILITY IN THIN-FILM DEVICES

被引：63

作者：

JANOSSY, I ^{[1
]}

TAGHIZADEH, MR ^{[1
]}

MATHEW, JGH ^{[1
]}

SMITH, SD ^{[1
]}

机构：

[1] CENT RES INST PHYS,H-1525 BUDAPEST 114,HUNGARY

来源：

IEEE JOURNAL OF QUANTUM ELECTRONICS | 1985年 / 21卷 / 09期

关键词：

D O I：

10.1109/JQE.1985.1072840

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

页码：1447 / 1452

页数：6

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[10] MICROSECOND ROOM-TEMPERATURE OPTICAL BISTABILITY AND CROSSTALK STUDIES IN ZNS AND ZNSE INTERFERENCE FILTERS WITH VISIBLE-LIGHT AND MILLIWATT POWERS [J].

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