EFFECT OF AN APPLIED TRANSVERSE MAGNETIC-FIELD ON FLOW-STRESS OF SUPERCONDUCTING LEAD

被引：2
作者：
HUTCHISON, TS [1 ]
MCBRIDE, SL [1 ]
机构：
[1] ROY MIL COLL CANADA,KINGSTON,ONTARIO,CANADA
来源：
CANADIAN JOURNAL OF PHYSICS | 1975年 / 53卷 / 10期
关键词：
D O I：
10.1139/p75-119
中图分类号：
O4 [物理学];
学科分类号：
0702 ;
摘要：
引用
收藏
页码：945 / 947
页数：3
相关论文
共 50 条
[21]   STRIATIONS IN A TRANSVERSE MAGNETIC-FIELD [J].
IGITKHANOV, YL ;
PETROV, VG ;
YAKUBOV, IT ;
KRUZHILIN, NA ;
NEDOSPASOV, AV .
HIGH TEMPERATURE, 1971, 9 (06) :1037-+
[22]   STABILITY OF PLANE HARTMANN FLOW SUBJECT TO A TRANSVERSE MAGNETIC-FIELD [J].
POTTER, MC ;
KUTCHEY, JA .
PHYSICS OF FLUIDS, 1973, 16 (11) :1848-1851
[23]   BREAKDOWN IN TRANSVERSE MAGNETIC-FIELD [J].
BABICKY, V ;
KOLACEK, K .
CZECHOSLOVAK JOURNAL OF PHYSICS, 1975, 25 (11) :1220-1230
[24]   EFFECT OF THE MAGNETIC-FLUX TRAPPING UPON THE TEMPERATURE-DEPENDENCE OF THE FLOW-STRESS CHANGE AT THE SUPERCONDUCTING TRANSITION [J].
DOTSENKO, VI ;
PUSTOVALOV, VV ;
SIRENKO, VA ;
FOMENKO, VS .
CRYSTAL RESEARCH AND TECHNOLOGY, 1984, 19 (08) :1031-1038
[25]   PEAK EFFECT IN SUPERCONDUCTING FILMS IN PARALLEL MAGNETIC-FIELD [J].
ICHKITIDZE, LP ;
SKOBELKIN, VI .
FIZIKA NIZKIKH TEMPERATUR, 1981, 7 (01) :117-120
[26]   SUPERCONDUCTING CORRUGATED FILM IN A TRANSVERSE MAGNETIC-FIELD NEAR HC2 [J].
KUZII, VV .
FIZIKA NIZKIKH TEMPERATUR, 1982, 8 (02) :180-187
[27]   MAGNETIC-FIELD DEPENDENCE OF SUPERCONDUCTING FLUX FLOW RESISTANCE MINIMUM [J].
JOINER, WCH ;
THOMPSON, J .
SOLID STATE COMMUNICATIONS, 1972, 11 (10) :1393-&
[28]   CRITICAL CURRENT DEPENDENCE ON TRANSVERSE MAGNETIC-FIELD AT DIFFERENT WIDTH OF SUPERCONDUCTING FILMS [J].
ICHKITIDZE, LP ;
BABLIDZE, RA ;
SKOBELKIN, VI .
FIZIKA TVERDOGO TELA, 1985, 27 (10) :3116-3119
[29]   SUPERCONDUCTING NETWORKS IN A MAGNETIC-FIELD [J].
RAMMAL, R ;
LUBENSKY, TC ;
TOULOUSE, G .
PHYSICAL REVIEW B, 1983, 27 (05) :2820-2829
[30]   HIGH-TC SUPERCONDUCTING FILM IN A TRANSVERSE AC MAGNETIC-FIELD - LOSSES AND EFFECT OF LOWER CRITICAL-FIELD [J].
ATSARKIN, VA ;
VASNEVA, GA ;
ZYBTSEV, SG .
SUPERCONDUCTOR SCIENCE & TECHNOLOGY, 1994, 7 (06) :423-426
12345