PROBING THE SURFACE FORCES OF MONOLAYER FILMS WITH AN ATOMIC-FORCE MICROSCOPE

被引：296
|
作者：
BURNHAM, NA
DOMINGUEZ, DD
MOWERY, RL
COLTON, RJ
机构：
来源：
PHYSICAL REVIEW LETTERS | 1990年 / 64卷 / 16期
关键词：
D O I：
10.1103/PhysRevLett.64.1931
中图分类号：
O4 [物理学];
学科分类号：
0702 ;
摘要：
Using an atomic force microscope (AFM), we have studied the attractive and adhesive forces between a cantilever tip and sample surfaces as a function of sample surface energy. The measured forces systematically increased with surface energy. The AFM is very sensitive; changes in the surface forces (i.e., attraction and adhesion) of monolayer covered samples could be clearly discerned when only the surface group of the monolayer film was changed from -CH3 to -CF3. © 1990 The American Physical Society.
引用
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页码：1931 / 1934
页数：4
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