ION-BEAM MIXING OF AG ON GLASS

被引：0

作者：

WANG, KM

BURMAN, C

LANFORD, WA

GROLEAU, R

机构：

[1] UNIV MONTREAL,PHYS NUCL LAB,MONTREAL H3C 3J7,QUEBEC,CANADA

[2] SHANDONG UNIV,DEPT PHYS,JINAN,PEOPLES R CHINA

来源：

RADIATION EFFECTS LETTERS | 1985年 / 85卷 / 04期

关键词：

D O I：

暂无

中图分类号：

TL [原子能技术]; O571 [原子核物理学];

学科分类号：

0827 ; 082701 ;

摘要：

引用

页码：177 / 183

页数：7

共 14 条

[1]

Burman C., 1982, Scientific Basis for Nuclear Waste Management. Proceedings of the Fourth International Symposium on the Scientific Basis for Nuclear Waste Management, P641

[2]

Chu WK., 1978, BACKSCATTERING SPECT

[3] EFFECT OF ION BOMBARDMENT ON ADHESION OF ALUMINIUM FILMS ON GLASS [J].

COLLINS, LE ;

PERKINS, JG ;

STROUD, PT .

THIN SOLID FILMS, 1969, 4 (01) :41-&

[4] ION-BEAM-INDUCED ATOMIC MIXING [J].

HAFF, PK ;

SWITKOWSKI, ZE .

JOURNAL OF APPLIED PHYSICS, 1977, 48 (08) :3383-3386

[5] ION-BEAM MIXING IN AMORPHOUS-SILICON .2. THEORETICAL INTERPRETATION [J].

MATTESON, S ;

PAINE, BM ;

NICOLET, MA .

NUCLEAR INSTRUMENTS & METHODS, 1981, 182 (APR) :53-61

[6] ION BEAM MIXING IN AMORPHOUS SILICON - 1. EXPERIMENTAL INVESTIGATION. [J].

Matteson, S. ;

Paine, B.M. ;

Grimaldi, M.G. ;

Mezey, G. ;

Nicolet, M.A. .

Nuclear instruments and methods, 1981, 182 /183 (pt 1) :43-51

[7] ION-BEAM-INDUCED REACTIONS IN METAL-SEMICONDUCTOR AND METAL-METAL THIN-FILM STRUCTURES [J].

MAYER, JW ;

TSAUR, BY ;

LAU, SS ;

HUNG, LS .

NUCLEAR INSTRUMENTS & METHODS, 1981, 182 (APR) :1-13

[8] COMPARISON OF ION-BEAM MIXING AT ROOM-TEMPERATURE AND 40-K [J].

PAINE, BM ;

NICOLET, MA ;

NEWCOMBE, RG ;

THOMPSON, DA .

NUCLEAR INSTRUMENTS & METHODS, 1981, 182 (APR) :115-119

[9] THEORETICAL ASPECTS OF ATOMIC MIXING BY ION-BEAMS [J].

SIGMUND, P ;

GRASMARTI, A .

NUCLEAR INSTRUMENTS & METHODS, 1981, 182 (APR) :25-41

[10]

TILDON ET, UNPUB E DEP I DATA M

← 1 2 →