THEORY FOR OPTIMUM CENSORED ACCELERATED LIFE TESTS FOR NORMAL AND LOGNORMAL LIFE DISTRIBUTIONS

被引：116
作者：
NELSON, W
KIELPINSKI, TJ
机构：
[1] GE, SCHENECTADY, NY 12345 USA
[2] USAF, 6514 TEST SQUADRON, HILL AFB, UT 84406 USA
来源：
TECHNOMETRICS | 1976年 / 18卷 / 01期
关键词：
D O I：
10.2307/1267923
中图分类号：
O21 [概率论与数理统计]; C8 [统计学];
学科分类号：
020208 ; 070103 ; 0714 ;
摘要：
引用
收藏
页码：105 / 114
页数：10
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