INSITU OBSERVATION BY X-RAY SYNCHROTRON TOPOGRAPHY OF THE GROWTH OF PLASTICALLY DEFORMED REGIONS AROUND CRACK TIPS IN SILICON UNDER CREEP CONDITIONS

被引：20
作者：
MICHOT, G [1 ]
GEORGE, A [1 ]
机构：
[1] UNIV PARIS 11,LURE,BATIMENT 209C,F-91405 ORSAY,FRANCE
来源：
SCRIPTA METALLURGICA | 1982年 / 16卷 / 05期
关键词：
D O I：
10.1016/0036-9748(82)90262-9
中图分类号：
TF [冶金工业];
学科分类号：
0806 ;
摘要：
引用
收藏
页码：519 / 524
页数：6
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