X-RAY-DIFFRACTION OF MULTILAYERS AND SUPERLATTICES

被引：293

作者：

BARTELS, WJ

HORNSTRA, J

LOBEEK, DJW

机构：

来源：

ACTA CRYSTALLOGRAPHICA SECTION A | 1986年 / 42卷

关键词：

D O I：

10.1107/S0108767386098768

中图分类号：

O6 [化学];

学科分类号：

0703 ;

摘要：

引用

页码：539 / 545

页数：7

共 26 条

[1] X-RAY DOUBLE-CRYSTAL DIFFRACTOMETRY OF GA1-XALXAS EPITAXIAL LAYERS [J].

BARTELS, WJ ;

NIJMAN, W .

JOURNAL OF CRYSTAL GROWTH, 1978, 44 (05) :518-525

[2] CHARACTERIZATION OF THIN-LAYERS ON PERFECT CRYSTALS WITH A MULTIPURPOSE HIGH-RESOLUTION X-RAY DIFFRACTOMETER [J].

BARTELS, WJ .

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1983, 1 (02) :338-345

[3]

BONSE U, 1977, XRAY OPTICS, P93

[4]

Born M, 1980, PRINCIPLES OPTICS

[5] EFFECT OF CRYSTAL PERFECTION AND POLARITY ON ABSORPTION EDGES SEEN IN BRAGG DIFFRACTION [J].

COLE, H ;

STEMPLE, NR .

JOURNAL OF APPLIED PHYSICS, 1962, 33 (07) :2227-&

[6]

Darwin CG, 1914, PHILOS MAG, V27, P675, DOI 10.1080/14786440408635139

[7] The theory of X-ray reflexion. [J].

Darwin, C. G. .

PHILOSOPHICAL MAGAZINE, 1914, 27 (157-62) :315-333

[8]

Ewald PP, 1917, ANN PHYS-BERLIN, V54, P519

[9] SOME PROPERTIES OF SINGLE-CRYSTAL ROCKING CURVE IN BRAGG CASE [J].

FINGERLA.A .

ACTA CRYSTALLOGRAPHICA SECTION A-CRYSTAL PHYSICS DIFFRACTION THEORETICAL AND GENERAL CRYSTALLOGRAPHY, 1971, A 27 (MAY1) :280-&

[10] THE INTERPRETATION OF X-RAY ROCKING CURVES FROM III-V SEMICONDUCTOR-DEVICE STRUCTURES [J].

HALLIWELL, MAG ;

LYONS, MH ;

HILL, MJ .

JOURNAL OF CRYSTAL GROWTH, 1984, 68 (02) :523-531

← 1 2 3 →