INVERSION OF NORMAL-INCIDENCE (R,T) MEASUREMENTS TO OBTAIN N + IK FOR THIN-FILMS

被引：79

作者：

PAULICK, TC

机构：

来源：

APPLIED OPTICS | 1986年 / 25卷 / 04期

关键词：

D O I：

10.1364/AO.25.000562

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

引用

页码：562 / 564

页数：3

共 10 条

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[8] A NUMERICAL-METHOD FOR DETERMINING THE COMPLEX REFRACTIVE-INDEX FROM REFLECTANCE AND TRANSMITTANCE OF SUPPORTED THIN-FILMS [J].

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[9] A THEORETICAL STUDY OF SENSITIVITIES OF SOME NORMAL INCIDENCE METHODS FOR MEASURING OPTICAL CONSTANTS AND THICKNESSES OF THIN FILMS [J].

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[10]

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