ON THE RESOLUTION OF THE LOW-ENERGY ELECTRON REFLECTION MICROSCOPE BASED ON WAVE ELECTRON OPTICS

被引：10

作者：

SHAO, Z ^{[1
]}

CREWE, AV ^{[1
]}

机构：

[1] UNIV CHICAGO,ENRICO FERMI INST,CHICAGO,IL 60637

来源：

关键词：

D O I：

10.1016/0304-3991(89)90214-3

中图分类号：

TH742 [显微镜];

学科分类号：

摘要：

引用

页码：199 / 204

页数：6

共 9 条

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[5]

SHAO Z, 1988, 46TH P ANN EMSA M MI

[6]

SHAO ZF, 1988, OPTIK, V79, P105

[7]

SWORYKIN VK, 1945, ELECTRON OPTICS ELEC

TELIEPS, W ;

BAUER, E .

[9] THE (7X7)[--](1X1) PHASE-TRANSITION ON SI(111) [J].

TELIEPS, W ;

BAUER, E .