STORAGE EFFECT IN PHOTOSTIMULATED EXOELECTRON EMISSION FROM SCRATCHED ALUMINUM

被引：16

作者：

SHIGEKAWA, H

HYODO, SI

机构：

来源：

JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS | 1982年 / 21卷 / 09期

关键词：

D O I：

10.1143/JJAP.21.1278

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

引用

页码：1278 / 1282

页数：5

共 50 条

[1] INTENSITY VS TIME PROFILES OF PHOTOSTIMULATED EXOELECTRON EMISSION FROM SCRATCHED ALUMINUM
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[2] EFFECT OF OXIDE THICKNESS ON PHOTOSTIMULATED EXOELECTRON EMISSION FROM ALUMINUM
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[3] EFFECT OF TEMPERATURE AND AIR HUMIDITY ON PHOTOSTIMULATED EXOELECTRON EMISSION FROM OXIDE FILMS ON ALUMINUM
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[4] A NOTE ON ELECTRON-TRANSFER TO EXOELECTRON EMISSION SOURCES FROM SCRATCHED ALUMINUM
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[5] PHOTOSTIMULATED EXOELECTRON EMISSION OF BEO
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[6] PHOTOSTIMULATED EXOELECTRON EMISSION FROM SLIP LINES - REBUTTAL
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[7] PHOTOSTIMULATED EXOELECTRON EMISSION FROM SLIP LINES - COMMENT
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[8] PHOTOSTIMULATED EXOELECTRON EMISSION (PSEE) IMAGES OF ALUMINUM SURFACE DAMAGED BY MECHANICAL TREATMENTS
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[9] A VERSATILE PHOTOSTIMULATED EXOELECTRON EMISSION MICROSCOPE AS APPLIED TO OBSERVING MECHANICAL DAMAGE ON ALUMINUM SURFACES
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[10] PHOTOSTIMULATED EXOELECTRON EMISSION (PSEE) DURING TENSILE DEFORMATION OF ALUMINUM SINGLE-CRYSTAL
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