共 7 条
[2]
CROS Y, IN PRESS
[3]
ELFERINK JBO, 1986, SURF INTERFACE ANAL, V9, P293
[4]
TIME-OF-FLIGHT SYSTEM FOR PROFILING RECOILED LIGHT-ELEMENTS
[J].
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH,
1983, 218 (1-3)
:11-15
[6]
HIGH-RESOLUTION RUTHERFORD BACKSCATTERING SPECTROMETRY AND THE ANALYSIS OF VERY THIN SILICON-NITRIDE LAYERS
[J].
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH,
1982, 200 (2-3)
:499-504
[7]
YU R, 1986, SURF SCI, V177, pL987, DOI 10.1016/0039-6028(86)90133-0