THE EFFECT OF DOPING ON FERMI LEVEL POSITION AT A SEMICONDUCTOR-METAL INTERFACE

被引:17
作者
ZUR, A
MCGILL, TC
SMITH, DL
机构
来源
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B | 1983年 / 1卷 / 03期
关键词
D O I
10.1116/1.582607
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
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页码:608 / 609
页数:2
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