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THIN-FILM COMPOSITIONAL ANALYSIS - COMPARISON OF TECHNIQUES
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JOURNAL OF VACUUM SCIENCE & TECHNOLOGY,
1975, 12 (01)
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Hedman J., 1972, PHYS SCRIPTA, V5, P93, DOI [10.1088/0031-8949/5/1-2/015, DOI 10.1088/0031-8949/5/1-2/015]
[4]
ION-BEAM SPUTTERING - EFFECT OF INCIDENT ION ENERGY ON ATOMIC MIXING IN SUBSURFACE LAYERS
[J].
RADIATION EFFECTS AND DEFECTS IN SOLIDS,
1974, 21 (04)
:209-215
[5]
HIGH-SPATIAL RESOLUTION AUGER-SPECTROSCOPY AND AUGER INTEGRATION APPLICATIONS
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JOURNAL OF VACUUM SCIENCE & TECHNOLOGY,
1975, 12 (01)
:370-374
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WEHNER GK, 1975, J VAC SCI TECNOL, V12, P356