共 12 条
- [1] THIN-FILM COMPOSITIONAL ANALYSIS - COMPARISON OF TECHNIQUES [J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY, 1975, 12 (01): : 144 - 150
- [3] Hedman J., 1972, PHYS SCRIPTA, V5, P93, DOI [10.1088/0031-8949/5/1-2/015, DOI 10.1088/0031-8949/5/1-2/015]
- [4] ION-BEAM SPUTTERING - EFFECT OF INCIDENT ION ENERGY ON ATOMIC MIXING IN SUBSURFACE LAYERS [J]. RADIATION EFFECTS AND DEFECTS IN SOLIDS, 1974, 21 (04): : 209 - 215
- [5] HIGH-SPATIAL RESOLUTION AUGER-SPECTROSCOPY AND AUGER INTEGRATION APPLICATIONS [J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY, 1975, 12 (01): : 370 - 374
- [10] WEHNER GK, 1975, J VAC SCI TECNOL, V12, P356