PARALLEL-PLATE COAXIAL SENSOR FOR DIELECTRIC MEASUREMENTS - FURTHER ANALYSIS

被引：5

作者：

ANDERSON, L

STUCHLY, SS

GAJDA, GB

机构：

[1] UNIV OTTAWA,DEPT ELECT ENGN,OTTAWA K1N 6N5,ONTARIO,CANADA

[2] COMMUN RES CTR,OTTAWA K2H 8S2,ONTARIO,CANADA

来源：

IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT | 1986年 / 35卷 / 01期

关键词：

D O I：

10.1109/TIM.1986.6499063

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

页码：89 / 91

页数：3

共 8 条

[1] INTEGRAL-EQUATION TECHNIQUE FOR SOLVING ROTATIONALLY SYMMETRIC ELECTROSTATIC PROBLEMS IN CONDUCTING AND DIELECTRIC MATERIAL [J].

DAFFE, J ;

OLSEN, RG .

IEEE TRANSACTIONS ON POWER APPARATUS AND SYSTEMS, 1979, 98 (05) :1609-1616

[2] AN EQUIVALENT-CIRCUIT OF AN OPEN-ENDED CO-AXIAL LINE [J].

GAJDA, G ;

STUCHLY, SS .

IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, 1983, 32 (04) :506-508

[3] NUMERICAL-ANALYSIS OF OPEN-ENDED CO-AXIAL LINES [J].

GAJDA, GB ;

STUCHLY, SS .

IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES, 1983, 31 (05) :380-384

[4] FRINGING FIELD-EFFECT IN LUMPED-CAPACITANCE METHOD FOR PERMITTIVITY MEASUREMENT [J].

ISKANDER, MF ;

STUCHLY, SS .

IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, 1978, 27 (01) :107-109

[5]

MARCUVITZ N, 1951, WAVEGUIDE HDB, P178

[6]

MITRA R, 1973, COMPUTER TECHNIQUES, P7

[7] PERMITTIVITY MEASUREMENTS AT MICROWAVE-FREQUENCIES USING LUMPED ELEMENTS [J].

STUCHLY, SS ;

RZEPECKA, MA ;

ISKANDER, MF .

IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, 1974, 23 (01) :56-62

[8]

WESTPHAL WB, 1954, DIELECTRIC MATERIALS, P63

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