DEVELOPMENT OF LOW OPERATING VOLTAGE 64-MBIT DRAM

被引:0
作者
KAGAMI, A
TSUKADA, S
KUWABARA, S
NISHIMOTO, S
机构
来源
NEC RESEARCH & DEVELOPMENT | 1995年 / 36卷 / 01期
关键词
DRAM; INTERNAL BOOSTED VOLTAGE; DIVIDED WORD DECODER; SENSE AMPLIFIER; TRIPLE WELL; COB (CAPACITOR OVER BIT-LINE); HSG (HEMISPHERICAL GRAIN SILICON);
D O I
暂无
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
The authors have developed the commercial product of low-power and high-speed 64 Mbit DRAMs, of which x 4, x 8 and x 16 bit I/O organizations are available in the same package by Lead On Chip (LOC) technology. The product is commercially available as a 3.3+/-0.3 V supply voltage DRAM, performs an access time (t(RAC)) of 38 ns (at V-CC = 3.0 V, T-a = 70 degrees C); with an active current (I-CC1) of 56 mA in the x 8 bit I/O with 8,192 refresh cycle mode (at V-CC = 3.6 V, t(RC) = 130 ns), utilizing a triple well and an internal boosted voltage generator. Cost increase factors have been cut through the selection of a divided word decoder scheme with main and sub word-lines. This paper describes method, circuit, device and process technologies used in this DRAMs.
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页码:72 / 82
页数:11
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